Orthogonal Defect Classification for Defect Control

        This paper describes Orthogonal Defect Classification, a means by which defects can be used to provide feedback on the development process. A careful selection of classification codes with orthogonal properties provide signatures in the distribution of the codes. These signatures reflect the progress of the process, detect departures when they occur, and provide the necessary insight to make adjustments. The properties of software defects are captured by the defect type, defect trigger, source, impact, and environment attributes. The paper describes these attributes and illustrates their use with results from pilot studies in many IBM labs. It is noted that Orthogonal Defect Classification has the merit of being independent of product, thereby providing a framework for general use.

By: R. Chillarege, I. Bhandari, J. Chaar, M. Halliday, D. Moebus, B. Ray and M. Wong

Published in: RC17320 in 1991

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