Imaging Hot-Electron Emission From Metal-Oxide-Semiconductor Structures

By: Marian Mankos, R. M. Tromp, M. C. Reuter, E. Cartier

Published in: RC20246 in 1995

This Research Report is not available electronically. Please request a copy from the contact listed below. IBM employees should contact ITIRC for a copy.

Questions about this service can be mailed to reports@us.ibm.com .