Electrical Test Sites For AMLCD-TFT Array Process Characterization

By: E. G. Colgan, R. J. Polastre, M. Takeichi, R. L. Wisnieff

Published in: RC21151 in 1998

This Research Report is not available electronically. Please request a copy from the contact listed below. IBM employees should contact ITIRC for a copy.

Questions about this service can be mailed to reports@us.ibm.com .