Fabrication of Multilayer Ferroelecric Films

        Multilayers of strontium bismuth tantalate (Sr0.9Bi2.2Ta2O9, SBT) with bismuth titanate (Bi4Ti3O12, BT), and SBT and strontium bismuth niobate (Sr0.9Bi2.2Nb2O9, SBN) with BT were prepared by chemical solution deposition (CSD). The CSD solutions were a mixture of strontium, tantalum, niobium and titanium butoxyethoxides and bismuth ethylhexanoate dissolved in butoxyethanol. The multilayer SBT and SBN with BT, and SBT with BT films were deposited by spin casting on Pt(100 nm)/SiO2/Si substrates. For comparison, SBT films were fabricated and annealed at 800°C for 30 min, a percentage of capacitors could be tested for ferroelectricity, and a 2Pr of 15 µC/cm2 at 3V was typically measured. Multilayer SBT, and SBT and SBN with BT were rapidly thermally annealed for a total (including post electrode anneal) of 22-30 min at 750°C. The multilayer SBT and SBN with BT, and SBT with BT films exhibited a wide range of 2Pr values ranging from 2-14 µC/cm2 at 3V but had a larger percentage of measurable capacitors after post electrode anneal than the SBT only films. In addition, no fatigue was observed after 1011 cycles in a SBT with BT multilayer structure

By: Deborah A. Neumayer, Peter R. Duncombe, Robert B. Laibowitz, Thomas Shaw, Lisa Berndt, C. T. Black

Published in: RC21400 in 1999

This Research Report is not available electronically. Please request a copy from the contact listed below. IBM employees should contact ITIRC for a copy.

Questions about this service can be mailed to reports@us.ibm.com .