3D-XY Critical Behavior in La2-xSrxCuO4 Thin Films Probed by Penetration Depth Measurement

We sketch the evidence for anisotropic 3D-XY critical behavior in La(2-x)Sr(x)CuO(4) thin films and explore the implications of this scenario, supplemented by the experimental phase transition line.

By: Y. Jaccard (Univ. de Neuchatel, Switz.), T. Schneider, J. P. Locquet, E. J. Williams, O. Fischer (Univ. de Geneve, Switz.) and P. Martinoli (Univ. de Neuchatel, Switz.)

Published in: Czechoslovak Journal of Physics, volume 46, (no S2), pages 1079-80 in 1996

Please obtain a copy of this paper from your local library. IBM cannot distribute this paper externally.

Questions about this service can be mailed to reports@us.ibm.com .