Reliable Tip Preparation for High-Resolution Scanning Tunneling Microscopy

Copyright © (1994) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

        No Abstract Available.

By: O. Albrektsen (Tele Danmark Res., Den.), H. W. M. Salemink, K. A. Morch (Tech. Univ. of Denmark) and A. R. Tholen (Tech. Univ. of Denmark)

Published in: Journal of Vacuum Science and Technology B, volume 12, (no 6), pages 3187-90 in 1994

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