Copyright © (2001) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics
Heat conduction governs the ultimate writing and reading capabilities of a thermomechanical data storage device. This work investigates transient heat conduction in a Joule-heated atomic force microscope cantilever through measurement and simulation of cantilever thermal and electrical behavior. The time required to heat a single cantilever to bit-writing temperature is near 1ls and the thermal data reading sensitivity D R/R is near 1 X 10-4 per vertical nm. Finite-difference thermal and electrical simulation results compare well with electrical measurements during writing and reading, indicating design tradeoffs in power requirements, data writing speed, and data reading sensitivity. We present a design for a new cantilever that is predicted to be faster and more sensitive than the present cantilever.
Keyword: Duerig
By: W.P. King, T.W. Kenny, K.E.Goodson, G. Cross, M. Despont, U. Dürig, H. Rothuizen, G.K. Binnig, P. Vettiger
Published in: Applied Physics Letters, volume 78, (no 9), pages 1300-2 in 2001
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