In this paper we survey major problems faced by EDA tools in tackling deep submicron (DSM) design challenges like: crosstalk, reliability, power, and interconnect dominated delay. We discuss the need for rethinking quality models used in EDA tools to allow early and reliable planning, estimation, analysis, and optimization. Key design quality metrics from a CAD tool perspective are surveyed, and methodologies and directions are proposed for the next generation design automation tools, intended to meet the challenges ahead. Ideas such as forward synthesis, incremental synthesis, system-level interconnect prediction and planning, and their implications on design quality, design tool architecture, and design methodology are explored.
By: Amir H. Farrahi, David J. Hathaway, Maogang, Majid Sarrafzadeh
Published in: RC21618 in 1999
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