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By: M. Pfister, M. B. Johnson, S. F. Alvarado, H. W. Salemink, U. Marti (Inst. de Micro -et Optoelectronique, Switzerland), D. Martin, F. Morierge, F. K. Reinhart
Published in: Applied Physics Letters, volume 65, (no 9), pages 1168-70 in 1994
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