By: M. Pfister (Inst. Micro- et Optoelectronique, Switz.) , M. B. Johnson , U. Marti (Inst. Micro- et Optoelectronique, Switz.) , S. F. Alvarado , H. W. M. Salemink , D. Martin (Inst. Micro- et Optoelectronique, Switz.) , F. Morier-Genoud (Inst. Micro- et Optoelectronique, Switz.) , R. K. Reinhart (Inst. Micro- et Optoelectronique, Switz.)
Published in: Luminescence: Proceedings of the 13th Pfefferkorn Conference. Chicago, IL, Scanning Microscopy International, p.87-92 in 1998
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