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In this paper, the self-consistent, frequency-dependent dielectric constant, er(f), and dielectric loss, tand(f), of several materials are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. The simple measurement technique is performed in the time domain on representative printed-circuit board wiring. Broadband, fully-causal transmission-line models based on these results are generated up to 50 GHz for card wiring using low loss materials including BT, Nelco N4000-13, and Nelco N4000-13SI. Simulation and modeling results highlight the need for the accurate frequency-dependent dielectric loss extraction. Signal propagation based on these results shows very good agreement with measured step and pulse time-domain excitations and provides validation of the measurement and model generation technique.
By: A. Deutsch, T.-M. Winkel, G. V. Kopcsay, C. W. Surovic, B. J. Rubin, G. A. Katopis, B. J. Chamberlin, R. S. Krabbenhoft
Published in: IEEE Transactions on Advanced Packaging, volume 28, (no 1), pages 4-12 in 2005
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