It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the cantilever is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.
By: M. Neu, N. Moll, L. Gross, G. Meyer, F. J. Giessibl, J. Repp
Published in: RZ3870 in 2014
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