Unique X-Ray Diffraction Pattern at Grazing-Incidence from Misfit Dislocations in SiGe Thin Films

Copyright © (1996) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

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By: J. L. Jordan-Sweet, P. M. Mooney, M. A. Lutz, R. M. Feenstra (Carnegie Mellon Univ.), J. O. Chu and F. K. LeGoues

Published in: Journal of Applied Physics, volume 80, (no 1), pages 89-96 in 1996

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