Electric-Field Penetration Into Metals: Consequences For High-Dielectric-Constant Capacitors

Copyright [©] (1999) by IEEE. Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distrubuted for profit. To copy otherwise, to republish, to post on servers, or to redistribute to lists, requires prior specific permission and/or a fee.

By: C. T. Black, J. J. Welser

Published in: IEEE Transactions on Electron Devices, volume 46, (no 4), pages 776-80 in 1999

Please obtain a copy of this paper from your local library. IBM cannot distribute this paper externally.

Questions about this service can be mailed to reports@us.ibm.com .