Probing Depth of UV Photoemission Electron Microscopy

Copyright © (2003) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

The probing depth of photoelectron emission microscopy has been determined for photon excitation energies of 5 eV. For Ag overlayers deposited on Fe, it is found that the probing depth is extremely large, i.e. 16.2 nm. This result is compared with probing depths of related techniques, and the physical mechanisms responsible for this bulk sensitivity are discussed.

By: G.K.L. Marx, P.-O. Jubert, A. Bischof, and R. Allenspach

Published in: Applied Physics Letters, volume 83, (no 14), pages 2925-2927 in 2003

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