De-convolving Variability in Technology/Circuit Co-Design

A SPICE-based Monte Carlo simulation methodology is described and used to analyze performance variability in 90nm PD-SOI circuits. Process and operating parameters of NAND chains and 16-bit adders are subjected to simulated variations in manufacturing process and operating conditions. Overall variability levels in delay and active power are compared across logic evaluation style, circuit complexity, and architecture. Individual parameter contributions to total variation levels are de-convolved; the most variation-sensitive parameters and designs are identified.

By: Ruth Wang; Paul Friedberg; Kerry Bernstein; Dale Pearson; Mark. B. Ketchen; Wilfried E. Haensch

Published in: RC23586 in 2005


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