Unit Cell Distortion Induced by Epitaxial Stress in La(2-x)Sr(x)CuO(4-delta) Thin Films

        Using a molecular beam epitaxy deposition technique, c-axis oriented La(2-x)Sr(x)CuO(4-delta) very thin films were prepared on (001) SrTiO(3) substrates. Structural properties were analyzed by x-ray diffraction (XRD) and transmission electron microscopy, and reveal the existence of a distortion of the film unit cell with respect to the bulk material. This distortion is induced by the significant film-substrate mismatch. Intensity analysis of XRD peaks suggests a modification of the relative position of the apical oxygen, which could be responsible for the reduction of the critical temperature in thin films.

By: Y. Jaccard, D. Ariosa (Univ. de Neuchatel, Switz.), E. J. Williams, F. Arrouy, J. P. Locquet, O. Fischer (Univ. de Geneve, Switz.) and P. Martinoli (Univ. de Neuchatel, Switz.)

Published in: RZ2731 in 1995


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