Imaging of Trapped Charge in SiO2 and at the SiO2-Si Interface

Copyright © (2001) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

By: R. Ludeke, E. Cartier

Published in: Applied Physics Letters, volume 78, (no 25), pages 3998-4000 in 2001

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