STM-Excited Electroluminescence and Spectroscopy on Organic Materials for Display Applications

Presented here is an overview of the current status of our work on scanning-tunneling-microscope-based (STM) spectroscopy and electroluminescence (EL) excitation to study the physical and electronic structure of organic materials used in organic light-emitting devices (OLEDs). By these means we probe the critical device parameters in charge-carrier injection and transport, i.e. the height of the barrier for charge-carrier injection at interfaces between different materials and the energy gap between positive and negative polaronic states. In combination with optical absorption measurements, we gauge the exciton binding energy, a parameter that determines energy transport and electroluminescence efficiency. In STM experiments involving organic electroluminescence excitation the tip functions as an OLED electrode in a highly localized fashion, allowing one to map the spatial distribution of the EL intensity across thin-film samples with nanometer lateral resolution as well as to measure the local EL emission spectra and the influence of thin-film morphology.
IBM J. Res. Develop. vol. 45, no. 1, p. 89-100, 2001.

By: S.F. Alvarado, L. Rossi, P. Müller, P. F. Seidler, and W. Rieß

Published in: RZ3272 in 2001

LIMITED DISTRIBUTION NOTICE:

This Research Report is available. This report has been submitted for publication outside of IBM and will probably be copyrighted if accepted for publication. It has been issued as a Research Report for early dissemination of its contents. In view of the transfer of copyright to the outside publisher, its distribution outside of IBM prior to publication should be limited to peer communications and specific requests. After outside publication, requests should be filled only by reprints or legally obtained copies of the article (e.g., payment of royalties). I have read and understand this notice and am a member of the scientific community outside or inside of IBM seeking a single copy only.

rz3272.pdf

Questions about this service can be mailed to reports@us.ibm.com .