Characterization of Substrate/Thin Film Interfaces With X-Ray Microdiffraction

By: I. C. Noyan, J. Jordan-Sweet, E. G. Liniger, S. K. Kaldor

Published in: RC21076 in 1998

This Research Report is not available electronically. Please request a copy from the contact listed below. IBM employees should contact ITIRC for a copy.

Questions about this service can be mailed to reports@us.ibm.com .