Along with the extraordinary success of low cost amorphous silicon (a-Si) TFTLCDs, technical and cost effectiveness of the TFT-array test is today's focus. In this paper we discuss the current TFT-array testing status and show the next generation TFT-array testing method for higher resolution a-Si TFTLCDs. The benefits of a lower cost testing method without any degradation of the testing quality are discussed.
By: M. Kodate, F. R. Libsch, T. Iwami, L. Jenkins, M. Mastro, Y. Mekata R. Polastre, T. Taguchi, H. Yamamoto
Published in: RC21433 in 1999
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